"अवलोकन टनलिंग सूक्ष्मदर्शी यंत्र": अवतरणों में अंतर
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पंक्ति 139:
* G. Binnig, H. Rohrer, Ch. Gerber, and E. Weibel, [http://dx.doi.org/10.1063/1.92999 Appl. Phys. Lett., Vol. 40, Issue 2, pp. 178-180 (1982)]
* R. V. Lapshin, Feature-oriented scanning methodology for probe microscopy and nanotechnology, [http://stacks.iop.org/Nano/15/1135 Nanotechnology, volume 15, issue 9, pages 1135-1151, 2004]
[[cs:STM]]
[[da:Scanning Tunnel Microscope]]
[[de:Rastertunnelmikroskop]]
[[en:Scanning tunneling microscope]]
[[es:Microscopio de efecto túnel]]
[[fa:میکروسکوپ تونلی روبشی]]
[[fi:Tunnelointimikroskooppi]]
[[fr:Microscope à effet tunnel]]
[[ja:走査型トンネル顕微鏡]]
[[nl:Scanning Tunneling Microscopy]]
[[pl:Skaningowy mikroskop tunelowy]]
[[pt:Microscópio de corrente de tunelamento]]
[[ru:Сканирующий туннельный микроскоп]]
[[zh:扫描隧道显微镜]]
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