"अवलोकन टनलिंग सूक्ष्मदर्शी यंत्र": अवतरणों में अंतर

* G. Binnig, H. Rohrer, Ch. Gerber, and E. Weibel, [http://dx.doi.org/10.1063/1.92999 Appl. Phys. Lett., Vol. 40, Issue 2, pp. 178-180 (1982)]

* R. V. Lapshin, Feature-oriented scanning methodology for probe microscopy and nanotechnology, [http://stacks.iop.org/Nano/15/1135 Nanotechnology, volume 15, issue 9, pages 1135-1151, 2004]

 

[[cs:Řádkovací tunelový mikroskop]]

[[ja:走査型トンネル顕微鏡]]

[[nl:Scanning Tunneling Microscopy]]

[[pt:Microscópio de corrente de tunelamento]]

[[ru:Сканирующий туннельный микроскоп]]

[[simple:Scanning tunneling microscope]]

[[zh:扫描隧道显微镜]]